Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
awardedFraunhofer-Gesellschaft, Einkauf B12
Read the notice at vergabe-de ↗
Description
1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF.
Key facts
- Reference
- LOT-0000
- Procedure
- open
- Lots
- 1
- Contact
- Einkauf Wissenschaftliche Geräteeinkauf@zv.fraunhofer.de+49891205-0
- Regime
- publicSector
Awarded suppliers
- CAMECA SAS · FR105, FR
Supplier location as published: Gennevilliers Cedex, FR105, 92230, FR
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Provenance
- Source
- vergabe-de
- Notice id
- 60fecbae-1e2a-4100-95f2-a389f40ad3f2
- OCID
- ocds-mnwr74-07d5f8ae-fb66-4891-a6f8-a839f96af77e
- First seen
- 30 Oct 2026
- Last updated
- 30 Oct 2026
Licence CC0 1.0 public domain dedication ↗
Source: Bekanntmachungsservice (oeffentlichevergabe.de), Beschaffungsamt des BMI — CC0 1.0.
GET /api/v1/tenders/3539bf96-decc-4e4f-a4b8-b0db0b635547The source notice is authoritative — verify deadlines and documents there before bidding.