Denmark – Scanning electron microscopes – The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
openDanmarks Tekniske Universitet - DTU · 30060946
Description
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
Key facts
- Procedure
- open
- Contact
- miktaa@dtu.dk
- Contract period
- 4 Dec 2026 → …
- Regime
- publicSector
- Category
- supplies
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Provenance
- Source
- ted-eu
- Notice id
- 713490-2026
- First seen
- 15 Oct 2026
- Last updated
- 15 Oct 2026
Licence EU reuse — Commission Decision 2011/833/EU ↗
Source: TED — Tenders Electronic Daily (ted.europa.eu), © European Union, reused under Commission Decision 2011/833/EU.
GET /api/v1/tenders/4cad5e47-2984-46fd-bb33-f3e646518ccdThe source notice is authoritative — verify deadlines and documents there before bidding.