Metrology SEM+FIB system
awardedNederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Read the notice at tenderned ↗
Value
unstated
Published
3 Nov 2026
Deadline
7 Sept 2026, 12:00 BST
Type
award
31712000 · Electrical machinery & apparatus38900000 · Laboratory, optical & precision equipment
Description
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers.
Key facts
- Reference
- 604044
- Procedure
- Openbaar
- Category
- Overheidsopdracht
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Provenance
- Source
- tenderned
- Notice id
- 447403
- First seen
- 3 Nov 2026
- Last updated
- 3 Nov 2026
Licence CC0 1.0 public domain dedication ↗
Source: TenderNed, via data.overheid.nl (CC0 1.0).
View at source ↗
GET /api/v1/tenders/7e03d6af-6012-46cd-ada8-26905eb9c6c0The source notice is authoritative — verify deadlines and documents there before bidding.