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4,5-Zoll-Probecard

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Fraunhofer ENAS

Read the notice at vergabe-de ↗

Value
unstated
Published
13 Nov 2026
Deadline
27 Nov 2026, 11:00 GMT · 13d left · as published, verify on the notice
Type
opportunity

Description

Für Hochleistungsprüfungen an 150-mm- und 200-mm-Wafern wird eine 4,5-Zoll-Probekarte benötigt. Das Design der Probekarte muss an das jeweilige Layout des Wafers angepasst werden. 4,5-Zoll-Probecard

Key facts

Lots
1
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Provenance

Source
vergabe-de
Notice id
26037394
OCID
ocds-mnwr74-26037394
First seen
14 Nov 2026
Last updated
14 Nov 2026

Licence CC0 1.0 public domain dedication ↗

Source: Bekanntmachungsservice (oeffentlichevergabe.de), Beschaffungsamt des BMI — CC0 1.0.

View at source ↗GET /api/v1/tenders/c282b2a1-007f-4f75-be2b-d13ae9a272b3

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