Germany – Miscellaneous special-purpose machinery – Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
awardedFraunhofer-Gesellschaft, Einkauf B12
Description
1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF.
Key facts
- Procedure
- open
- Contact
- einkauf@zv.fraunhofer.de
- Regime
- publicSector
- Category
- supplies
Awarded suppliers
- CAMECA SAS · FR67403092216 · FR105, FR
Supplier location as published: Gennevilliers Cedex, FR105, 92230, FR
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Provenance
- Source
- ted-eu
- Notice id
- 751866-2026
- First seen
- 29 Oct 2026
- Last updated
- 29 Oct 2026
Licence EU reuse — Commission Decision 2011/833/EU ↗
Source: TED — Tenders Electronic Daily (ted.europa.eu), © European Union, reused under Commission Decision 2011/833/EU.
GET /api/v1/tenders/df290f97-8ad0-44b9-a7c3-f19f629f28d8The source notice is authoritative — verify deadlines and documents there before bidding.