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2D Röntgenmikroskop - PR1285582-2590-W

awarded

Fraunhofer-Gesellschaft, Einkauf B12

Read the notice at vergabe-de ↗

Value
unstated
Published
27 Oct 2026
Deadline
—
Type
award
38510000 · Laboratory, optical & precision equipmentDE212

Description

1 pc. The X-ray system to be procured is intended for non-destructive 2D X-ray inspection of components ranging from small parts to medium-sized assemblies. In particular, it is intended for the inspection of embedded circuits with structures in the low single-digit micrometer range, such as MEMS packaging via wafer molding, chip-in-polymer, system-in-package, etc. In addition, a correspondingly large power reserve is required for the inspection of power electronics assemblies with heat sinks featuring copper layers up to 6 mm thick.

Key facts

Reference
LOT-0000
Procedure
open
Lots
1
Contact
Einkauf Wissenschaftliche Geräte
einkauf@zv.fraunhofer.de
+49891205-0
Regime
publicSector

Awarded suppliers

Supplier location as published: Wunstorf, DE929, 31515, DE

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Provenance

Source
vergabe-de
Notice id
16ecc721-832b-4ea0-acd1-d616112ae478
OCID
ocds-mnwr74-1df40014-e5a8-4887-8313-546afd3fd64d
First seen
30 Oct 2026
Last updated
30 Oct 2026

Licence CC0 1.0 public domain dedication ↗

Source: Bekanntmachungsservice (oeffentlichevergabe.de), Beschaffungsamt des BMI — CC0 1.0.

View at source ↗GET /api/v1/tenders/f078115f-ad79-49b1-bfb7-065f0eb9d352

The source notice is authoritative — verify deadlines and documents there before bidding.